纳米片
晶体管
材料科学
计算机科学
电子工程
能量(信号处理)
光电子学
计算机体系结构
电气工程
纳米技术
工程类
物理
量子力学
电压
作者
Geoffrey Yeap,Shiwei Lin,Huiling Shang,H.C. Lin,Yu Chieh Peng,Mu‐Chun Wang,P. W. Wang,Ching‐Po Lin,K.F. Yu,Won‐Young Lee,H. Y. Chen,Da-Wei Lin,Byung-Do Yang,CC Yeh,Christopher T. Chan,J. Kuo,Chih‐Min Liu,T.K. Chiu,Mei Wen,T.L. Lee
标识
DOI:10.1109/iedm50854.2024.10873475
摘要
A leading edge 2nm CMOS platform technology (N2) has been developed and engineered for energy-efficient compute in AI, mobile and HPC applications. This industry-leading N2 logic technology features energy-efficient gate-all-around nanosheet transistors, middle-of-line and backend-of-line interconnects with densest SRAM macro of $\sim 38\text{Mb}/\text{mm}^{2}$. N2 delivers a full node benefit from previous 3nm node [4] in offering 15% speed gain or 30% power reduction with $> 1.15\mathrm{x}$ chip density increase. N2 platform technology, equipped with new Cu scalable RDL, flat passivation and TSVs, co-optimizes holistically with 3DFabric™ technology enabling system integration/scaling for AI/mobile/HPC product designs. N2 successfully met wafer-level reliability requirements and passed 1000hrs HTOL qual with high yielding 256Mb HC/HD SRAM, and logic test chip ($> 3\mathrm{B}$ gates) consisting of CPU/GPU/ SoC blocks. Currently in risk production, N2 platform technology is scheduled for mass production in 2H'25. N2P, 5% speed enhanced version of N2 with full GDS compatibility, targets to complete qualification in 2025 and mass production in 2026.
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