铋
衍射
硫系化合物
X射线晶体学
结晶学
材料科学
钒
钼
金属
光学
表面光洁度
钛
同步加速器
表面粗糙度
凝聚态物理
物理
化学
光电子学
冶金
复合材料
作者
Aaron Miller,Mellie Lemon,Marisa A. Choffel,Sarah R. Rich,Fischer G. Harvel,David C. Johnson
标识
DOI:10.1515/znb-2022-0020
摘要
Abstract The presence of Laue oscillations in a film grown on a solid surface is broadly taken as indicating a high quality, crystallographically aligned film of the targeted compound. In this paper we briefly review the origins of both Laue oscillations and Kiessig fringes and show how they can be used together to determine if extra thickness exists above or below the coherently diffracting domains. The differences between experimental and “ideal” films are discussed and the effect of structural features (roughness, different thickness coherently diffracting domains and thickness in addition to the coherently diffracting domains) are illustrated with experimental and simulated data for metal and mixed-metal chalcogenide films of titanium, bismuth, vanadium/iron, and bismuth/molybdenum. Examples are given showing how quantitative information can be extracted from experimental diffraction patterns.
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