铜
电镀
电化学
材料科学
镀铜
电镀(地质)
化学工程
氯化物
沉积(地质)
冶金
无机化学
电极
复合材料
化学
图层(电子)
物理化学
古生物学
沉积物
工程类
地质学
生物
地球物理学
作者
Wei‐Ping Dow,De-Huei Liu,Chun-Wei Lu,Chien‐Hung Chen,Jhih-Jyun Yan,Sumei Huang
摘要
A copper electroplating process using a single organic additive was developed for filling through holes of printed circuit boards. The organic additive acted as an inhibitor of copper deposition in the presence of chloride ions and . This copper electroplating formula resulted in center-up filling, which differs from the bottom-up filling exhibited by blind microvias. The inhibiting strength of the organic additive and the filling capability of the plating solution strongly depended on the concentration of . The electrochemical behavior of the organic additive was characterized by electrochemical analyses and imaging of TH cross sections.
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