碳化硅
裂变
透射电子显微镜
产品(数学)
工程物理
材料科学
图书馆学
历史
工程类
核物理学
纳米技术
物理
冶金
计算机科学
中子
几何学
数学
作者
Subhashish Meher,Isabella J. van Rooyen,Khalid Hattar
标识
DOI:10.1017/s143192762001613x
摘要
Journal Article In-situ High Temperature Ion Irradiation Transmission Electron Microscopy to Understand Fission Product Transport in Silicon Carbide of TRISO Fuel Get access Subhashish Meher, Subhashish Meher Idaho National Laboratory, Idaho Falls, Idaho, United States Search for other works by this author on: Oxford Academic Google Scholar Isabella van Rooyen, Isabella van Rooyen Idaho National Laboratory, Idaho Falls, Idaho, United States Search for other works by this author on: Oxford Academic Google Scholar Khalid Hattar Khalid Hattar Sandai National Laboratories, Albuquerque, New Mexico, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 870–871, https://doi.org/10.1017/S143192762001613X Published: 01 August 2020
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