锰
结构精修
电子衍射
结晶学
软锰矿
晶体结构
材料科学
衍射
X射线晶体学
粉末衍射
化学
透射电子显微镜
分析化学(期刊)
物理
纳米技术
冶金
光学
色谱法
作者
D. E. Simon,R. W. Morton,Jason Gislason
摘要
Electrolytic Manganese Dioxide (EMD) material was analyzed by Rietveld refinement of x-ray diffraction patterns to answer the question, “Is EMD composed of gamma- or epsilon-MnO2?” An electron diffraction study of EMD using a 20 nanometer spot size electron beam reported observing only the e-MnO2 structure and no γ-MnO2 structure. However, a Transmission Electron Microscopy (TEM) study of EMD observed only γMnO2 structure as revealed by atom planes with a 0.4 nanometer spacing along with crystal twinning. Rietveld refinement results of EMD x-ray diffraction patterns indicate that EMD can be adequately described using both the gamma- and epsilon-manganese dioxide (γ-MnO2 and e-MnO2) phases with an occasional occurrence of pyrolusite (βMnO2). It is proposed that the e-MnO2 structure observed in both electron and x-ray diffraction patterns is only a signature of a disordered manganese occupancy of the long range hexagonal oxygen framework and not a discrete phase, and EMD material predominately composed of short range ordered γ-MnO2.
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