高电子迁移率晶体管
宽带
晶体管
电气工程
回波损耗
炸薯条
插入损耗
真延时
电压
计算机科学
物理
电子工程
拓扑(电路)
工程类
相控阵
天线(收音机)
作者
Jeong Geun Kim,Donghyun Baek,Jeong Geun Kim,Donghyun Baek
出处
期刊:Sensors
[Multidisciplinary Digital Publishing Institute]
日期:2023-07-31
卷期号:23 (15): 6827-6827
被引量:2
摘要
This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt transistor in the inter-stages to improve the bandwidth and SPDT (Single Pole Single Throw) switches at the input and the output ports. The delay lines are implemented with CLC π-networks with the lumped element to ensure a compact chip size. A negative voltage generator and an SPI controller are implemented in the PCB (Printed Circuit Board) due to the lack of digital control logic in GaN technology. A maximum time delay of ~182 ps with a time delay resolution of 10.5 ps is achieved at DC–6 GHz. The RMS (Root Mean Square) time delay and amplitude error are <5 ps and <0.6 dB, respectively. The measured insertion loss is <6.8 dB and the input and output return losses are >10 dB at DC–6 GHz. The current consumption is nearly zero with a 3.3 V supply. The chip size including pads is 2.45 × 1.75 mm2. To the authors’ knowledge, this is the first demonstration of a true time delay IC using GaN HEMT technology.
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