材料科学
薄膜
X射线光电子能谱
拉曼光谱
纳米晶材料
三氧化钨
带隙
分析化学(期刊)
兴奋剂
钒
化学工程
纳米技术
钨
光学
光电子学
冶金
有机化学
工程类
物理
化学
作者
Srinivasa Rao Sriram,P. Nagaraju,Saidi Reddy Parne,Damodar Reddy Edla
标识
DOI:10.1149/2162-8777/ace5d8
摘要
Undoped and vanadium-doped tungsten trioxide (V–WO 3 ) nanocrystalline thin films were prepared on glass substrates with spray pyrolysis. The synthesized films were characterized using XRD, Raman spectroscopy, AFM, FESEM, UV-visible spectroscopy, and XPS for micro-structural, topographical, optical and chemical properties. The results showed that XRD analysis confirmed that WO 3- based thin films were hexagonal phases. The FESEM images showed the interconnected nanoflake-like morphology of the undoped and V–WO 3 thin films. Atomic Force Microscopy (AFM) investigations confirmed that the average surface roughness of the thin films ranged from 3.36 nm to 14.2 nm. The optical energy bandgap of the films was estimated from the optical spectrum of absorption. The static liquid distribution method was utilized to examine the gas-sensing characteristics of deposited films. The results show that the 4 wt% vanadium-doped WO 3 sensor responds to ethanol vapour at room temperature. The response and recovery times towards 50 ppm of ethanol gas were determined as 32 and 21 s, respectively. The 4 wt% V-WO 3 film has shown a response of 2.8, which is 2.15 times more than the undoped WO 3 .
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