Characterization Techniques of Nanowires

A nanowire has a cylindrical structure at the nanoscale, which has a diameter range of ~10-9 meters. For a detailed study about nanowires, including particle size, particle distribution, crystal structure at the nanolevel, and deposition on a textile substrate, ultra-modern characterization techniques are needed, such as a particle size analyzer, scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), energy dispersive X-ray (EDX), ultraviolet-visible (UV) spectroscopy, and atomic microscopy. Every technique has some strengths and limitations so it is increasingly complicated to discover which technique is superior. It is necessary to go through the characterization technique to understand a nanowire's physical, electronic, optical, and also chemical properties. The significance of nanowire research and also applications is increasing rapidly, so researchers must separate fields to overcome the challenges in the reliable and reproducible characterization of nanowires after the synthesis and other process stages. So here we discuss various characterization techniques of the nanowire with favorable applications.