Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope

Journal Article Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope Get access Oriol Gavalda-Diaz, Oriol Gavalda-Diaz Composites Research Group, Faculty of Engineering, The University of Nottingham, Nottingham, UK Search for other works by this author on: Oxford Academic Google Scholar Michele Conroy, Michele Conroy Department of Materials, Department of Materials, Imperial College London, UK Search for other works by this author on: Oxford Academic Google Scholar Finn Giuliani Finn Giuliani Department of Materials, Department of Materials, Imperial College London, UK Corresponding author: f.giuliani@imperial.ac.uk Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Page 2340, https://doi.org/10.1017/S1431927622008984 Published: 01 August 2022