扫描电子显微镜
X射线光电子能谱
材料科学
扫描隧道显微镜
红外光谱学
光谱学
纳米技术
质谱法
显微镜
蚀刻(微加工)
光电子学
分析化学(期刊)
光学
化学工程
化学
复合材料
物理
色谱法
工程类
有机化学
量子力学
图层(电子)
作者
Bev Rogers,Joseph G. Shapter,William Skinner,K. Gascoigne
摘要
A new method of producing Pt–Ir tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flight–secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock Pt–Ir wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely.
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