Electronic Structure and Optoelectronic Properties of Bismuth Oxyiodide Robust against Percent‐Level Iodine‐, Oxygen‐, and Bismuth‐Related Surface Defects
半导体
作者
Tahmida N. Huq,Lana C. Lee,Lissa Eyre,Weiwei Li,Robert A. Jagt,Chaewon Kim,Sarah Fearn,Vincenzo Pecunia,Felix Deschler,Judith L. MacManus-Driscoll,Robert L. Z. Hoye