光学
显微镜
反褶积
分辨率(逻辑)
共焦显微镜
光传递函数
材料科学
空间频率
共焦
相位恢复
点扩散函数
显微镜
相(物质)
傅里叶变换
图像分辨率
摄影术
超分辨显微术
扫描共焦电子显微镜
物理
计算机科学
衍射
人工智能
量子力学
作者
Yuxuan Qiu,Yongfeng Huang,Xin Liu,Yusen Zhang,Xiang Hao,Cuifang Kuang,Xu Liu
出处
期刊:Optics Letters
[The Optical Society]
日期:2022-03-25
卷期号:47 (7): 1721-1721
摘要
In confocal microscopy, the effective optical transfer function (OTFeff) with Gaussian plane wave illumination covers very few high-frequency components, which prohibits further improvement of the resolution. We propose modulated pattern scanning microscopy (MPSM) to achieve super-resolution imaging. In MPSM, the phase of the illumination beam is modulated to reassign the OTFeff in the Fourier domain. The phase mask is designed using an optimization algorithm to obtain the fluorescence emission pattern with rich high-frequency components. Then, the postprocessing algorithms are adapted to retrieve the super-resolved images from the modulated recordings. Simulation and experiment demonstrate that MPSM increases the resolution approximately 1.3 times better than confocal microscopy. Compared with conventional deconvolution, MPSM exhibits a higher signal-to-noise ratio.
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