光学
光场
领域(数学)
结构光
微电子机械系统
物理
光电子学
数学
纯数学
作者
Yupei Miao,Ziwei Wang,Xiaojie Zhang,Shuling Xu,Zewei Cai,Xiang Peng,Xiaoli Liu
出处
期刊:Optics Express
[The Optical Society]
日期:2025-06-13
卷期号:33 (13): 28122-28122
摘要
Fringe projection profilometry (FPP) is widely used in industrial metrology and 3D scanning. However, relying on traditional lens-based imaging mechanism, existing FPP systems face challenges in achieving high-precision measurement over large depth range. To overcome this limitation, this paper presents an approach integrating micro-electro-mechanical system (MEMS) projection with light field imaging (LFI). To accurately characterize the projection-imaging relationship across a large depth of field (DOF), an extended depth ray fusion model (EDRFM) is proposed, utilizing ray tracing to unify the representation of both projection and imaging processes. Furthermore, phase consistency ensures spatial alignment across multiple viewpoints, and a fusion method incorporating the angle between projection-camera rays and phase modulation quality is introduced to reduce errors caused by view variations. Experimental results demonstrate that the proposed method achieves a measurement accuracy of 0.12 mm within a 650 mm depth range.
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