数据表
香料
氮化镓
高电子迁移率晶体管
晶体管
晶体管型号
计算机科学
电子工程
半导体器件建模
功率半导体器件
功率(物理)
材料科学
电气工程
工程类
电压
纳米技术
物理
CMOS芯片
图层(电子)
量子力学
作者
J. Zarębski,Damian Bisewski
出处
期刊:Energies
[MDPI AG]
日期:2023-11-18
卷期号:16 (22): 7643-7643
被引量:3
摘要
This paper focuses on the problem of the modeling of FET power transistors made of gallium nitride offered by GaN Systems, Transphorm, and Nexperia. The considered devices have been available on the market since 2014. GaN-FETs are built as a cascade connection of a normally on gallium nitride HEMT and a normally off MOSFET made of silicon. On the manufacturer’s sites, one can find models of these devices for like-SPICE tools in the text form. The main goal of this paper is to evaluate the model’s accuracy by comparing calculation results obtained by the use of the considered models with the authors’ measurement results and datasheet. It has been demonstrated that the GaN Systems model built on controlled sources described by a set of arbitrarily selected mathematical functions more accurately reproduces the basic characteristics of a transistor. On the other hand, the models from Transphorm and Nexperia, which are constructed based on built-in semiconductor device models, more precisely calculate the values of selected functional transistor parameters.
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