母线
焊接
材料科学
丝网印刷
光电子学
等效串联电阻
接触电阻
电阻式触摸屏
太阳能电池
复合材料
电气工程
图层(电子)
工程类
电压
作者
Henning Schulte‐Huxel,Thomas Daschinger,Byungsul Min,Till Brendemühl,Rolf Brendel
标识
DOI:10.1016/j.solmat.2023.112601
摘要
The need to reduce the silver consumption for future global PV production requires novel approaches for cell metallization and module integration. A screen-printed aluminum cell metallization on the front side could contribute here, but requires a redesign of the solder pads and busbars. A compromise between shading and resistive losses is needed. We investigate the inclusion of Ag solder pads in high-aspect-ratio Al finger grids on the front side of p-type back junction solar cells featuring passivating polysilicon on oxide (POLO) contacts on the rear side. In order to determine the optimal geometric dimensions of the solder pads, we characterize the resistance at the interface between the Ag solder pads and the Al finger grid in dependence on the size of the overlap between the two paste. A contact resistance of 285 mΩ is determined for 200 μm-narrow Al busbars and small solder pads of 750 μm in length. This would require tens of solder pads per busbar for acceptable power losses below 0.5 % coming along with significant shading. Therefore, a new metallization design is developed. We use narrow Ag busbars with a widened intersection to the Al fingers in order to reduce the contact resistance caused by the Ag–Al alloy. Thereby, the shading losses of the solderable busbars and pads are less than 1.5 %.
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