Stable field writing in magnetic domain wall memory devices by suppression of thermal disturbances

Abstract We examined the stability of writing in a magnetic domain wall device from the Oersted field induced by electrical current flowing in an embedded metal line. We found that the Joule heating from the writing current raises the device temperature, leading to destabilization of its magnetization after the pulse ends abruptly. To address this issue, we suggested adding a falling trailing edge to the main writing pulse, providing a stabilizing Oersted magnetic field while the device temperature reduces. We found the adequate trailing edge length fits to the thermal transient obtained from the 3D thermal simulations. This approach improved the writing stability of the device and highlights the importance of writing pulse shape and thermal management for stable writing of domain wall devices.