纤锌矿晶体结构
X射线光电子能谱
材料科学
光致发光
一氧化碳
化学工程
薄膜
粒度
铟
氧气
纳米结构
晶界
分析化学(期刊)
纳米技术
锌
微观结构
冶金
催化作用
光电子学
化学
有机化学
工程类
作者
Aninamol Ani,P. Poornesh,K.K. Nagaraja,Gopalkrishna Hegde,Еvgeny Kolesnikov,И. В. Щетинин,Albin Antony,Suresh D. Kulkarni
标识
DOI:10.1007/s10854-021-06745-1
摘要
Abstract Herein, we report the role of indium (In) on the carbon monoxide sensing of ZnO thin films using a low-cost spray pyrolysis technique. The decrease in crystalline size was observed from XRD studies and hexagonal wurtzite structure was confirmed. Photoluminescence and XPS studies proved the presence of various defects in the films. The gas-sensing properties of films toward carbon monoxide (CO) gas indicate that 15 wt% of In in ZnO thin films (IZO) exhibit high response (1.84) to a low concentration of the gas (1 ppm) at 300 °C compared to undoped ZnO (0.53). The observed high response of 15 wt% IZO can be mainly endorsed to the oxygen vacancy defects as observed from the photoluminescence and XPS analysis. Further, the high response is complemented by high surface area and smaller grain size (~ 13.1 nm) with well-defined grain boundaries as evident from SEM analysis as well as XRD studies.
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