凝聚态物理
双层石墨烯
单层
超晶格
扫描隧道显微镜
石墨烯
磁场
材料科学
拓扑绝缘体
范德瓦尔斯力
物理
纳米技术
量子力学
分子
作者
Zhengwen Wang,Yingzhuo 英卓 Han 韩,Kenji Watanabe,Takashi Taniguchi,Yuhang Jiang,Jinhai 金海 Mao 毛
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2024-04-07
卷期号:33 (6): 067301-067301
被引量:1
标识
DOI:10.1088/1674-1056/ad3b8a
摘要
Unraveling the mechanism underlying topological phases, notably the Chern insulators (ChIs) in strong correlated systems at the microscopy scale, has captivated significant research interest. Nonetheless, ChIs harboring topological information have not always manifested themselves, owing to the constraints imposed by displacement fields in certain experimental configurations. In this study, we employ density-tuned scanning tunneling microscopy (DT-STM) to investigate the ChIs in twisted monolayer–bilayer graphene (tMBG). At zero magnetic field, we observe correlated metallic states. While under a magnetic field, a metal–insulator transition happens and an integer ChI is formed emanating from the filling index s = 3 with a Chern number C = 1. Our results underscore the pivotal role of magnetic fields as a powerful probe for elucidating topological phases in twisted Van der Waals heterostructures.
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