散热片
材料科学
结温
热阻
微流控
鳍
功率密度
薄脆饼
光电子学
炸薯条
硅
三维集成电路
体积流量
热的
机械工程
集成电路
纳米技术
电气工程
功率(物理)
复合材料
热力学
工程类
物理
作者
Yue Zhang,Ashish Dembla,Muhannad S. Bakir
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2013-07-03
卷期号:3 (11): 1842-1850
被引量:45
标识
DOI:10.1109/tcpmt.2013.2267492
摘要
Microfluidic cooling is proposed as a solution to reject heat from a 3-D IC stack of high power chips. However, the integration of interlayer microfluidic cooling in 3-D ICs inevitably increases wafer thickness and thus presents possible challenges for through-silicon via (TSV) integration. This paper discusses the thermal and electrical co-design of a microfluidic heat sink compatible with TSV technology. A TSV-compatible micropin-fin heat sink (MPFHS) with a height of 200 μm, a micropin-fin diameter of 150 μm, and a pitch of 225 μm is fabricated. The fabricated MPFHS is experimentally shown to maintain the chip junction temperature at a power density for a flow rate of 70 mL/min. The thermal results are benchmarked with an air-cooled heat sink and a chip junction temperature reduction of is observed. A 3 × 3 array of TSVs, each with a diameter of 10 μm and a height of 178 μm (18:1 aspect ratio), is integrated into each micropin-fin. This results in a TSV density of 17424 cm -2 in the microfluidic heat sinks. Using four-point probing, the measured resistance of TSVs is 36.5±1.5 mΩ.
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