半径
干扰(通信)
干涉测量
光学
折射率
天文干涉仪
X射线光学
物理
X射线
材料科学
计算机科学
频道(广播)
计算机安全
电气工程
工程类
作者
Vahram Mkrtchyan,Ashot P. Aivazyan,Սարգիս Պետրոսյան,M. K. Balyan
标识
DOI:10.1107/s1600576724001742
摘要
The theoretical background to the formation of interference fringes in a triple Laue X-ray interferometer by a specimen having plano-concave form is presented. The interference fringes in the general case have an elliptical form. The relation between the radius of the specimen, the refractive index and the radii of the interference fringes is established. For two epoxy lenses having different radii, the interference fringes are registered. The refractive index and the radii are determined by measuring the radii of the obtained interference fringes.
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