84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test

The biggest challenge in launching Micro‐LED displays is cost reduction. In our previous report (1), we proposed a super cost‐effective test method embedding EL and electrical testing (PEMP TM ). In this paper, we report the validity of PEMP TM by comparing the external quantum efficiency (EQE) of LED emission and photodetection characteristics.