结晶
材料科学
退火(玻璃)
微晶
化学工程
无定形固体
化学气相沉积
多晶硅
薄膜
硅
结晶学
薄膜晶体管
复合材料
纳米技术
光电子学
冶金
化学
图层(电子)
工程类
作者
Zheng Wang,Huynh Thi Cam Tu,Keisuke Ohdaira
标识
DOI:10.35848/1347-4065/ac290e
摘要
Abstract Flash lamp annealing (FLA) is a short-duration annealing technique that can crystallize amorphous silicon (a-Si) films for thin-film polycrystalline Si (poly-Si) solar cells. We investigated the crystallization of n-type hydrogenated a-Si (n-a-Si:H) films formed by catalytic chemical vapor deposition on Si nitride- (SiN x - ) coated textured glass substrates. The n-a-Si:H films with a thickness of ∼2.7 μm were crystallized by FLA with no film peeling even without chromium adhesion layers. We also confirmed that the crystallization takes place through explosive crystallization (EC). The addition of phosphorous to the precursor a-Si:H slightly modifies the crystallization, resulting in different grain sizes and EC velocities compared to the case of EC of intrinsic a-Si:H.
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