材料科学
硼
半导体
光电子学
半导体器件
纳米技术
工程物理
工程类
物理
图层(电子)
核物理学
作者
Lis K. Nanver,Lin Qi,Xingyu Liu,Tihomir Knežević
标识
DOI:10.1016/j.sse.2021.108041
摘要
Nanolayers of pure boron (PureB) deposited on Si form p + -type regions at deposition temperatures from 50 • C to 700 • C. At 700 • C, commercial PureB photodiodes are produced for advanced detection systems including those in extreme-ultraviolet (EUV) lithography systems.In addition, potent MEMS applications of B-nanolayers have been demonstrated.Attractive diode characteristics were also found for devices where Ga wetting-layers were applied to the Si surface, both with/without an additional B capping-layer.The resulting "PureGa" and "Pure-GaB" diodes are assessed here in the light of investigations focused on the B-Si interface properties in PureB diodes.A very high density of acceptor states at the Si interface appears to be related to the p-dopant property of both B and Ga, even though diffusion into the Si is not expected for the applied processing temperatures from 50 • C to ~ 450 • C.
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