材料科学
MXenes公司
剥脱关节
微晶
X射线光电子能谱
蚀刻(微加工)
相(物质)
单层
高分辨率透射电子显微镜
化学工程
化学计量学
分析化学(期刊)
纳米技术
图层(电子)
石墨烯
物理化学
冶金
化学
有机化学
透射电子显微镜
工程类
作者
Tijin Thomas,Soorya Pushpan,J.A. Aguilar-Martínez,Alejandro Torres,Nayely Pineda‐Aguilar,Anabel Álvarez Méndez,K.C. Sanal
标识
DOI:10.1016/j.ceramint.2021.08.342
摘要
We report the synthesis of Mo2CTx MXene from the Mo–In–C non-MAX phase using UV-assisted safe etching in phosphoric acid followed by ultrasonic exfoliation. The EDX and XPS spectra confirm the selective etching of indium from the non-MAX phase stoichiometry and formation of Mo2CTx MXene. The structural characterization using X-Ray diffraction revealed the Mo–In–C non-MAX phase and Mo2CTx MXene with crystallite sizes 37.26±0.56 nm and 46.89±0.70 nm, respectively. The morphology of the samples analyzed using FESEM, confirmed the formation of the multilayered and monolayer 2D Mo2CTx. A slight increase in the interplanar spacing (~0.921 Å) was observed in HRTEM images for Mo2CTx with respect to Mo–In–C. The synthesis of Mo2C MXene from a non- MAX phase using a hydrogen fluoride-free safe etching root unlocks the wide opportunity for the industrial bulk production of MXenes.
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