倒装芯片
材料科学
焊接
可靠性(半导体)
包装工程
模具(集成电路)
电子工程
电子包装
炸薯条
热铜柱凸点
机械工程
集成电路封装
集成电路
复合材料
光电子学
工程类
电气工程
纳米技术
图层(电子)
功率(物理)
物理
胶粘剂
量子力学
作者
J.W. Wan,Wenjun Zhang,Donald J. Bergstrom
标识
DOI:10.1016/j.mejo.2006.09.017
摘要
Flip-chip underfill process is a very important step in the flip-chip packaging technology because of its great impact on the reliability of the electronic devices. In this technology, underfill is used to redistribute the thermo-mechanical stress generated from the mismatch of the coefficient of thermal expansion between silicon die and organic substrate for increasing the reliability of flip-chip packaging. In this article, the models which have been used to describe the properties of underfill flow driven by capillary action are discussed. The models included apply to Newtonian and non-Newtonian behavior with and without the solder bump resistance for the purpose of understanding the behavior of underfill flow in flip-chip packaging.
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