光电子学
材料科学
欧姆接触
响应度
肖特基势垒
电极
肖特基二极管
蓝宝石
电场
光电二极管
发光二极管
紫外线
波长
二极管
压电
图层(电子)
氮化镓
光学
光电探测器
化学
纳米技术
物理
激光器
物理化学
复合材料
量子力学
作者
Jun Ohsawa,Takahiro Kozawa,Osamu Ishiguro,Hiroshi Itoh
摘要
Light in wavelength ranges of 400 and 350 nm was selectively detected by changing the bias voltage of the diode. Piezoelectric field in a 20-nm-thick InGaN layer on an n-GaN/sapphire structure in combination with a back-incidence configuration was successfully utilized. The principle is based on a fact that a strained InGaN layer has an inward electric field, whereas the n-type underlayer has an outward field. Using a circular Schottky electrode of 1 mm diameter surrounded by an ohmic electrode, a responsivity of 0.06 A/W was obtained for both wavelength ranges by choosing a bias of either 0 or -5 V.
科研通智能强力驱动
Strongly Powered by AbleSci AI