镜面反射
X射线反射率
超晶格
材料科学
表面光洁度
辐照
离子
光学
各向异性
凝聚态物理
薄膜
化学
光电子学
纳米技术
物理
核物理学
复合材料
有机化学
作者
C. Schug,H. Grimm,R. Berger,Andreas Dietzel,Matthew Wormington
摘要
Abstract Co/Pt thin film superlattices with strong perpendicular anisotropy and out‐of‐plane coercivities of 5–11 kOe were irradiated with Xe + ions to tailor their magnetic properties. Specular and off‐specular x‐ray reflectivity (XRR) studies were performed to correlate the irradiation‐induced coercivity reduction with changes of the interfacial properties. Off‐specular XRR turned out to be particularly sensitive to the Co/Pt superlattice period. By applying the distorted wave Born approximation to simulate the diffusely scattered intensity, we were able to quantify the vertical roughness correlation throughout the superlattice stack. Study of a Co/Pt multilayer exposed to different Xe + ion doses suggests that progressive ion bombardment causes a gradual loss of conformality between the different interfaces and a change of the interface morphology, whereas initial vertical RMS roughness values are not affected. Copyright © 2004 John Wiley & Sons, Ltd.
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