材料科学
晶界
合金
电阻率和电导率
冶金
微观结构
电导率
应力腐蚀开裂
极限抗拉强度
腐蚀
电气工程
工程类
物理化学
化学
作者
Quanshi Cheng,Lingying Ye,Qingmei Huang,Yu Dong,Shengdan Liu
标识
DOI:10.1016/j.jmrt.2022.08.098
摘要
A two-stage overaging process was proposed to improve the electrical conductivity and stress corrosion cracking resistance (SCCR) of an Al–Zn–Mg–Cu alloy. The overaging process include a low-temperature aging at 120 °C for 5 h and a subsequent aging at 177 °C for 8, 14 and 24 h. The SCCR of the samples aged at 120 °C/5 h + 177 °C/24 h was higher than that of the T6 temper, at which the ISSRT is 1.2% and the electrical conductivity is 39.0%IACS. The increase of electrical conductivity is caused by the depletion of solution atoms during overaging. Meanwhile, the improvement of SCCR resistance is caused by the coarsening of grain boundary precipitates with higher Cu content. The tensile strength decreased from 663.5 MPa to 519.7 MPa, which is caused by the coarsen of strengthening precipitates in grains during overaging process.
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