光电探测器
宽带
光电子学
材料科学
电极
金属
光学
化学
物理
物理化学
冶金
作者
Manoj Kumar,Sanju Rani,Kuldeep Singh Gour,Kapil Kumar,Reena Yadav,Sudhir Husale,M. Dinesh Kumar,Vidya Nand Singh
出处
期刊:Materials advances
[Royal Society of Chemistry]
日期:2024-01-01
卷期号:5 (8): 3220-3227
被引量:10
摘要
Bias-dependent trapping and de-trapping can be seen in the SnSe device. At low bias, voltage trapping of the carriers can be seen in the device; they start to de-trap after 500 mV bias.
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