材料科学
光电探测器
光电子学
响应度
驻极体
紫外线
电子迁移率
复合材料
作者
Lili Luo,Rui Hao,Xiaoliang Hu,Yingtao Li,Erqing Xie,Zemin Zhang
标识
DOI:10.1002/adom.202300543
摘要
Abstract Metal oxide semiconductors have been developed for ultraviolet–visible photodetectors, but improving sensitivity has remained a challenge due to poor mobility and carrier losses. In this study, a high‐performance photodetector is achieved by implementing a chargeable electret to regulate carrier transmission properties in the CuBi 2 O 4 (CBO) conductive channel. As expected, the positively charged device shows improved performance, with a broadband detection range covering 250–600 nm, maximum responsivity and detectivity of around 10.65 A W −1 and 8.56 × 10 12 Jones, and a fast rise and decay time of 50 and 300 µs, respectively. Mechanism analyses suggest two roles of the electret layer: 1) positive charges in the electret layer attract electrons and leave a pure hole conductive channel with less carrier recombination and trapping; 2) holes in the conductive channel move in one direction with less carrier collision and scattering. This work has demonstrated an effective strategy for providing a durable and stable ultra‐high electrostatic field to improve the sensitivity of photodetectors.
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