光学
轮廓仪
结构光三维扫描仪
投影(关系代数)
噪音(视频)
相(物质)
相位噪声
计算机科学
材料科学
物理
表面光洁度
人工智能
算法
图像(数学)
扫描仪
量子力学
复合材料
出处
期刊:Applied Optics
[The Optical Society]
日期:2022-06-28
卷期号:61 (21): 6167-6167
被引量:7
摘要
For noise-induced phase error and phase unwrapping reliability in fringe projection profilometry (FPP), a new evaluation method is proposed. By introducing a Gaussian noise model, the maximum variance of the noise-induced phase error and phase unwrapping reliability are directly obtained. According to the proposed evaluation method, the variance of the noise-induced phase error is proportional to the noise variance and inversely proportional to the fringe modulation. The phase unwrapping reliability is not only inversely proportional to the noise-induced phase error, but also inversely proportional to the fringe frequency ratio. This work analyzes and compares three efficient dual-frequency phase unwrapping algorithms. The results show that the wrapped phase accuracy and phase unwrapping reliability based on 4 f H + 4 f L are the best, followed by 3 f H + 3 f L and 3 f H + 2 f L . However, 3 f H + 2 f L has the highest measurement efficiency.
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