材料科学
光探测
光电子学
响应度
异质结
光电探测器
光电流
紫外线
氮化镓
半导体
带隙
纳米技术
图层(电子)
作者
Harmanpreet Kaur Sandhu,J. John,Alka Jakhar,Abhishek Sharma,Alok Jain,Samaresh Das
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2022-04-19
卷期号:33 (30): 305201-305201
被引量:14
标识
DOI:10.1088/1361-6528/ac6817
摘要
Abstract Integration of nanolayered metal chalcogenides with wide-bandgap semiconductors forming pn heterojunction leads to the way of high-performance photodetection. This work demonstrates the fabrication of a few nanometer thick Molybdenum diselenide (MoSe 2 )/Mg-doped Gallium Nitride (p-GaN) heterostructure for light detection purposes. The device exhibits low noise broadband spectral response from ultraviolet to near-infrared range (300–950 nm). The band-alignment and the charge transfer at the MoSe 2 /p-GaN interface promote self-powered photodetection with high photocurrent to dark current ratio of 2000 and 1000 at 365 nm and 640 nm, respectively. A high responsivity of 130 A W −1 , detectivity of 4.8 × 10 10 Jones, and low noise equivalent power of 18 fW/Hz 1/2 at 365 nm is achieved at an applied bias of 1 V. Moreover, the transient measurements reveal a fast rise/fall time of 407/710 μ sec for the fabricated device. These outcomes exemplify the viability of MoSe 2 /p-GaN heterostructure for high-speed and low-noise broadband photodetector applications.
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