韧致辐射
原子物理学
电子结构
电荷(物理)
电子
库仑
结晶学
螺旋钻
电子相关
材料科学
物理
凝聚态物理
化学
核物理学
粒子物理学
作者
J. Ghijsen,L. H. Tjeng,J. van Elp,Henk Eskes,J. Westerink,G. A. Sawatzky,M. T. Czyżyk
出处
期刊:Physical review
日期:1988-12-01
卷期号:38 (16): 11322-11330
被引量:1556
标识
DOI:10.1103/physrevb.38.11322
摘要
The electronic structure of copper oxides has been investigated by photoelectron (x-ray photoemission, ultraviolet photoemission), Auger electron, and bremsstrahlung isochromat spectroscopies. The experimental results are compared with one-electron band-structure calculations as well as with a cluster configuration interaction model. It is demonstrated that the results for ${\mathrm{Cu}}_{2}$O agree well with band theory, whereas those for CuO clearly show strong deviations which we argue are due to electron-correlation effects in the open-shell $d$ bands. From the comparison to cluster calculations we extract values for the $\mathrm{Cu} d\ensuremath{-}d$ and $\mathrm{O} p\ensuremath{-}p$ Coulomb interactions, the O to Cu charge transfer energy, and the degree of $\mathrm{Cu} d\ensuremath{-}\mathrm{O} 2p$ hybridization. From this we demonstrate that CuO is a charge-transfer gap insulator.
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