可制造性设计
材料科学
发光二极管
产量(工程)
蓝宝石
光电子学
硅
外延
电子工程
纳米技术
电气工程
工程类
复合材料
光学
激光器
物理
图层(电子)
作者
Alexander Loesing,B. Slischka,Atsushi Nishikawa
摘要
One of the big challenges of micro LED displays is to reduce cost/increase yield and establish excellent manufacturability. Galliumnitride on silicon (GaN-on-Si) LED epiwafers offer fundamental cost advantages to the entire process flow for micro LEDs compared with conventional GaN-on-sapphire LED epiwafers. However, due to the difficulties of epitaxial growth of GaN-on-Si, demonstration of such cost advantages in micro LED application is not wide-spread yet. In this presentation, we have demonstrated excellent emission uniformity with well-controlled strain by precise strain-engineering. This opens the way to use the advantages of GaN-on-Si LED epiwafers in the entire supply chain of micro LED making and thus reduce cost significantly and enable high yield manufacturing.
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