材料科学
电磁屏蔽
蒸发
复合材料
制作
导电体
碳化钛
薄膜
MXenes公司
电磁干扰
光电子学
电磁干扰
极限抗拉强度
纳米技术
碳化物
电子工程
医学
物理
替代医学
病理
工程类
热力学
作者
Zhi Zhuang,Hongwu Chen,Chun Li
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-06-01
卷期号:17 (11): 10628-10636
被引量:10
标识
DOI:10.1021/acsnano.3c01697
摘要
Lightweight, thin electromagnetic interference (EMI) shielding film materials with high shielding effectiveness and good mechanical performance are highly required for flexible and portable electronics. Two-dimensional titanium carbide (Ti3C2Tx MXene) has a great potential to meet these requirements because of the easy fabrication of ultrathin conductive films via solution processing. However, the production of strong pristine MXene films is still challenged by the presence of voids and wrinkles, as well as inferior flake alignment. In this work, high-performance pristine MXene films are produced by a spatially confined evaporation approach with controlled wet film thickness. When the cast dispersion layer is sufficiently thin, the skin effect is suppressed during evaporation, producing films with improved flake alignment and much fewer structural defects. As a result, the pristine MXene films deliver an ultrahigh tensile strength of 707 MPa and a high modulus of 66 GPa, together with a high electrical conductivity of 16600 S cm-1. The high conductivity and intrinsic laminated structure endow the MXene films with superior EMI shielding performance in X-band (48.4 dB and 1.3 × 105 dB cm-2 g-1 for 1.0 μm thick films), being among the highest values reported.
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