X射线光电子能谱
镍
谱线
材料科学
金属
晶体结构
分析化学(期刊)
化学工程
结晶学
化学
冶金
环境化学
物理
工程类
天文
作者
Melissa Meyerson,Samantha G. Rosenberg,Bryan R. Wygant
摘要
Metal chalcogenides are of interest as electrocatalysts, battery materials, and more. XPS is a valuable tool for studying changes to these materials before and after catalysis, making reference spectra for the pristine materials valuable. Here, we present XPS spectra for a family of nickel sulfoselenide (NiSSe) materials based on the Ni3X2 crystal structure, Ni3S2−xSex. XPS surveys and high-resolution spectra of Ni 2p, S 2p, S 2s, Se 3d, Se 3p, and Se 3s were recorded using Al Kα radiation.
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