薄膜
材料科学
脉冲激光沉积
蓝宝石
基质(水族馆)
磁滞
半导体
钒
退火(玻璃)
衍射
过渡金属
电阻率和电导率
分析化学(期刊)
光电子学
激光器
纳米技术
光学
复合材料
化学
冶金
凝聚态物理
海洋学
色谱法
地质学
催化作用
电气工程
工程类
物理
生物化学
作者
D. H. Kim,Hoi Sing Kwok
摘要
High quality vanadium dioxide (VO2) thin films have been successfully deposited by pulsed laser deposition without postannealing on (0001) and (101̄0) sapphire substrates. X-ray diffraction reveals that the films are highly oriented with (010) planes parallel to the surface of the substrate. VO2 thin films on (0001) and (101̄0) substrates show semiconductor to metal transistions with electrical resistance changes as large as 4×104, 105, respectively. Thin films on (101̄0) substrate have a transition at as low as 55 °C with a hysteresis less than 1 °C. These transition properties are comparable with single crystal VO2.
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