X射线光电子能谱
石墨烯
拉曼光谱
结晶度
单晶
材料科学
表征(材料科学)
分析化学(期刊)
价(化学)
化学
作者
Eri Hashimoto,Keigo Tamura,Hayato Yamaguchi,Takeshi Watanabe,Fumihiko Matsui,Shinji Koh
标识
DOI:10.35848/1347-4065/ac4ad8
摘要
Abstract We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/α-Al 2 O 3 (0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray absorption spectroscopy, is a complementary characterization tool to conventional methods, such as Raman spectroscopy and atomic force microscopy, for comprehensive and quantitative characterization of graphene/Ir(111). Using PMM, we characterized the properties of CVD-grown graphene including the single-crystallinity, number of layers, crystal orientation, and degree of interaction between graphene and Ir(111) and clarified the relationship between these properties and the CVD growth conditions.
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