钨
氘
分析化学(期刊)
微晶
氦
热脱附光谱法
材料科学
化学
解吸
核反应分析
等离子体
电子回旋共振
离子
原子物理学
冶金
核物理学
吸附
物理
有机化学
色谱法
作者
О. В. Огородникова,T. Schwarz-Selinger,K. Sugiyama,V.Kh. Alimov
摘要
Influence of helium (He) on the deuterium (D) retention in tungsten (W) under simultaneous He-D plasma exposure was investigated. Bulk polycrystalline tungsten and two W coatings on carbon substrate, namely, plasma-sprayed tungsten and combined magnetron-sputtered and ion implanted tungsten (CMSII-W) were exposed to pure and He-seeded D plasmas generated by electron-cyclotron-resonance plasma source. The D retention in each sample was subsequently analyzed by various methods such as nuclear reaction analysis for the D depth profiling up to 6 μm and thermal desorption spectroscopy for the determination of total amount of D retention. It is shown that seeding of helium into D plasma with helium ion flux fraction of 10% reduces the deuterium retention for all tungsten grades but more significant reduction was observed for polycrystalline W and less significant effect was found for W coatings. From the thermal desorption spectroscopy measurements, we conclude that the presence of He modifies the density of existing traps for D but does not modify the nature of traps. Maximum effect of a reduction in the deuterium retention due to helium seeding was observed at around 500 K for bulk polycrystalline W. Mechanisms of deuterium retention and He effect in different W materials are discussed.
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