闪烁体
光学
反射器(摄影)
光传递函数
材料科学
基质(水族馆)
闪烁
蒸发
光电子学
物理
探测器
热力学
海洋学
地质学
光源
作者
Chaehun Lee,Gyuseong Cho,Bo Kyung,Hosang Jeon
标识
DOI:10.1080/00223131.2008.10875896
摘要
AbstractIsotropic light spread in the scintillator film decreases the spatial resolution of scintillator-based digital X-ray imaging systems such as digital radiography and mammography. Pixelation of the scintillator film could be a good solution to overcome this limitation. This has been demonstrated with pixilated CsI:Tl layers which was made by thermal evaporation process on a pre-patterned substrate or which was post-patterned by laser after preparation. Additionally, in order to minimize cross-talk between pixels and to maximize light collection efficiency, a reflection material can be coated on the top and side surfaces of each pixilated scintillator block. In This paper, several materials such as Al, and quarter-wave multilayer reflector with SiO2 and TiO2 were considered as the reflector materials of pixilated CsI:Tl scintillator blocks. Through a serious of simulations given below on these simple 2-dimensional scintillator blocks coated by a reflector, reflectivity, cross-talk, and modulation transfer function were calculated to find the optimum reflector.Keywords: Modulation Transfer Functionpixelated CsI:Tlreflectorsquarter-wave multilayer reflectorDigital Mammography
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