电容感应
电极
微波食品加热
衰减
材料科学
导线
特性阻抗
共面波导
电阻抗
插入损耗
光电子学
光学
声学
电子工程
电气工程
物理
工程类
电信
复合材料
量子力学
作者
JaeHyuk Shin,S.R. Sakamoto,Nadir Dagli
标识
DOI:10.1109/jlt.2010.2091624
摘要
In this paper, analytical expressions are presented for the microwave attenuation of slow wave electrodes obtained by periodically loading a regular coplanar line with capacitive elements. Such electrodes are commonly used in III-V compound semiconductor electro-optic modulators and other traveling wave devices. These results are obtained by modifying the existing analytical loss expressions for regular coplanar lines based on physical arguments. The predictions of these expressions are compared with experimental results up to 35 GHz and agreement is found to be very good. Validity of this analysis is also discussed. It is found that the approach works very well for lines of practical interest. Hence, the proposed approach enables complete design of capacitively loaded slow wave electrodes by predicting the microwave loss with closed-form equations in addition to velocity and characteristic impedance.
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