电子背散射衍射
相关
材料科学
电子衍射
冶金
衍射
反向散射(电子邮件)
电子
光学
微观结构
物理
核物理学
工程类
哲学
电信
无线
语言学
作者
Ondřej Ambrož,Patrik Jozefovič,Jan Čermák,Šárka Mikmeková
标识
DOI:10.1093/micmic/ozad067.1047
摘要
Journal Article Effect of Metallographic Pretreatment of TRIP Steel Specimens on Correlative Imaging and Electron Backscatter Diffraction Analysis Get access Ondřej Ambrož, Ondřej Ambrož Department of Electron Microscopy, Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Corresponding author: ondrej@isibrno.cz Search for other works by this author on: Oxford Academic Google Scholar Patrik Jozefovič, Patrik Jozefovič Search for other works by this author on: Oxford Academic Google Scholar Jan Čermák, Jan Čermák Search for other works by this author on: Oxford Academic Google Scholar Šárka Mikmeková Šárka Mikmeková Department of Electron Microscopy, Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 2023–2025, https://doi.org/10.1093/micmic/ozad067.1047 Published: 22 July 2023
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