Lv4
680 积分 2021-07-15 加入
A review of manufacturing technologies for silicon carbide superjunction devices
2个月前
已完结
Analysis on BVDSS Outlier Chips and Screening Technology for 1.2 kV Automotive SiC MOSFETs
2个月前
已完结
Analysis on two breakdown failure mechanisms of silicon carbide MOSFET devices with abnormally increased leakage current at low voltage
2个月前
已完结
A new high-voltage H2S single noxious gas reliability test for power modules
7个月前
已完结
Dendrite Formation in Power Electronics Packages during HV-H3TRB Testing due to Flux Residue
7个月前
已完结
Copper and silver sintered die-attach compared in HV-H3TRB and thermal shock cycling
7个月前
已完结
Carrier Lifetime Killer in 4H-SiC: Carrier Capture Path by Carbon Vacancies
8个月前
已完结
An Analysis of UIS Failure Mechanism of 4H-SiC MOSFET in Transition Region
10个月前
已完结
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