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20 积分 2024-09-10 加入
High Temperature Rapid Thermal Oxidation and Nitridation of 4H-SiC in Diluted N<sub>2</sub>O and NO Ambient
6个月前
已完结
Comparative Investigation on Aging Precursor and Failure Mechanism of Commercial SiC MOSFETs Under Different Power Cycling Conduction Modes
7个月前
已完结
A Deep Insight Into the Ionizing Radiation Effects and Mechanisms on the Dynamic Characteristics of SiC MOSFETs
8个月前
已完结
A Self-Consistent Approach Based on Bayesian Deconvolution for Trapping Time Constant Analysis: A Demonstration to Analyze ΔV TH Transients in p-GaN Gate Power HEMTs
8个月前
已完结
Semiconductor Material and Device Characterization
8个月前
已关闭
Semiconductor Material and Device Characterization
8个月前
已关闭
Characterization study of deep-level defect spatial distribution, emission mechanisms, and structural identification
8个月前
已完结
Temperature dependence of the capture cross section determined by DLTS on an MOS structure
8个月前
已完结
Revealing the Positive Bias Temperature Instability in Normally-OFF AlGaN/GaN MIS-HFETs by Constant-Capacitance DLTS
8个月前
已完结
Relating Gain Degradation to Defects Production in Neutron-Irradiated 4H-SiC Transistors
8个月前
已完结
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