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Active area patterning for CFET: nanosheet etch
8小时前
已完结
Towards accurate and efficient process simulations based on atomistic and neural network approaches
27天前
已完结
Attention Is All You Need
27天前
已关闭
Multiscale Lattice-Boltzmann Finite Difference Model for Thermal Conduction from Nanoscale Hot Spots
27天前
已关闭