Lv11
32 积分 2025-10-26 加入
Time-Dependent Dielectric Breakdown of 4H-SiC/$ \hbox{SiO}_{2}$ MOS Capacitors
1小时前
待确认
Gate Oxide Reliability of SiC MOSFETs and Capacitors Fabricated on 150mm Wafers
14天前
已完结
Time Dependent Dielectric Breakdown in High Quality SiC MOS Capacitors
14天前
已完结
Low test cost adaptive testing method for high yield IC products
27天前
已关闭
Positive Bias Temperature Instability in SiC-Based Power MOSFETs
30天前
已完结
Power-Law Time Exponent n and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction–Diffusion Theory
30天前
已完结
Remaining useful lifetime estimation for discrete power electronic devices using physics-informed neural network
1个月前
已完结
A Novel Surface-Potential-Based Modeling Methodology of SiC MOSFET With Physics-Informed Neural Network
1个月前
已完结
Degradation of hexagonal silicon-carbide-based bipolar devices
1个月前
已完结
High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects
1个月前
已完结
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