Lv510
1406 积分 2024-06-25 加入
一个磨镜子的
Towards a deeper understanding of the formation of friction-induced hillocks on monocrystalline silicon
3天前
已完结
Effects of crystal planes on topography evolution of silicon surface during nanoscratch-induced selective etching
1个月前
已完结
TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates
1个月前
已完结
Scratch formation and its mechanism in chemical mechanical planarization (CMP)
1个月前
已完结
The crystallographic change in sub-surface layer of the silicon single crystal polished by chemical mechanical polishing
1个月前
已完结
Study of the humidity-controlled CeO2 fixed-abrasive chemical mechanical polishing of a single crystal silicon wafer
1个月前
已完结
Chemical mechanical polishing of silicon wafers using developed uniformly dispersed colloidal silica in slurry
1个月前
已完结
Post cleaning of chemical mechanical polishing process
1个月前
已完结
Atomic-scale study on nanoparticle removal mechanism during post-Cu CMP cleaning process using ReaxFF MD
1个月前
已完结
Investigations on the mechanism of silica particle removal during the Cu buff cleaning process
1个月前
已完结
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