Lv3
250 积分 2023-09-09 加入
Copper precipitation in large-diameter Czochralski silicon
1个月前
已完结
Identification of Grown-In Defects in CZ Silicon after Cu Decoration
1个月前
已完结
The di‐interstitial in silicon: Electronic properties and interactions with oxygen and carbon impurity atoms
1个月前
已完结
Identification of Grown-In Defects in CZ Silicon after Cu Decoration
1个月前
已完结
Defect Control and Gettering in Cz-Silicon
1个月前
已完结
Morphology of Oxygen Precipitates in RTA Pre-Treated Czochralski Silicon Wafers Investigated by FTIR Spectroscopy and STEM
1个月前
已完结
Copper decoration and etching of crystal defects in SOI materials
1个月前
已完结
Physics of Copper in Silicon
1个月前
已完结
A Technique for Delineating Defects in Silicon
1个月前
已完结
Engineering analysis of microdefect formation during silicon crystal growth
1个月前
已完结
皖公网安备34019202002308
