Lv1
25 积分 2021-08-14 加入
Reliability characterisation of plasma induced charging damage (PID) for MOS transistors of a silicon on insulator (SOI) process using product relevant test structures and fWLR methods
3小时前
已完结
Influence of Salicide Block Oxide and Key Process Parameters on P+ Polysilicon Resistor Performance
4天前
已完结
Design of the Circuits for a CMOS CAN Transceiver Chip with Slew Rate Control
1个月前
已完结
A Current Reference With Multiple Nonlinear Current Mirrors to Reduce Noise, Mismatch, and Impact of Supply Voltage Variation
6个月前
已完结
A 69MHz-Bandwidth 40$V/\mu$s-Slew-Rate 3n$V/\surd{Hz}$-Noise 4.5$\mu$V-Offset Chopper Operational Amplifier
8个月前
已完结
A 288nV/√Hz low-noise capacitively-coupled instrumentation amplifier (CCIA) in 22-nm UTBB FD-SOI for signal conditioning of MEMS piezoresistive pressure sensors
8个月前
已完结
A Capacitively Coupled Chopper Instrumentation Amplifier With Deadtime Offset Reduction Technique for Neural Signal Sensing
8个月前
已完结
Noninverting Schmitt Trigger Circuit with Improved Hysteresis Behavior
10个月前
已完结
皖公网安备34019202002308
