Lv1
84 积分 2026-01-15 加入
Industrial reliability testing of transistor gate dielectrics
2个月前
已完结
Scaled contact length with low contact resistance in monolayer 2D channel transistors
4个月前
已完结
Evolution of ESD Robust IC Design: How ESD design and ESD control have changed our industry
4个月前
已完结
Device-scaling constraints imposed by the van der Waals gap formed in two-dimensional materials
4个月前
已完结
Test Structures to Study Interconnection Metal/Via/Contact Reliability under Transient Pulse Stresses of ESD and Surge Events
4个月前
已完结
Understanding and modelling the PBTI reliability of thin-film IGZO transistors
5个月前
已完结
The quantum limits of contact resistance and ballistic transport in 2D transistors
5个月前
已完结
Channel Length Dependence of PBTI in High-k First RMG Gate Stack Integration Scheme
7个月前
已关闭
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper
7个月前
已关闭
A BSIM-Based Predictive Hot-Carrier Aging Compact Model
7个月前
已关闭
An exploratory analysis of the latent structure of process data via action sequence autoencoders
皖公网安备34019202002308
