Lv11
86 积分 2026-01-15 加入
Test Structures to Study Interconnection Metal/Via/Contact Reliability under Transient Pulse Stresses of ESD and Surge Events
3小时前
待确认
Understanding and modelling the PBTI reliability of thin-film IGZO transistors
9天前
已完结
The quantum limits of contact resistance and ballistic transport in 2D transistors
16天前
已完结
Channel Length Dependence of PBTI in High-k First RMG Gate Stack Integration Scheme
3个月前
已关闭
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper
3个月前
已关闭
A BSIM-Based Predictive Hot-Carrier Aging Compact Model
3个月前
已关闭
Determination of proximity effect correction parameters for 0.1 μm electron-beam lithography
3个月前
已关闭
Voltage dependence of proximity effects in electron beam lithography
3个月前
已完结
10.1116/1.570288
3个月前
已关闭
An exploratory analysis of the latent structure of process data via action sequence autoencoders
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